Title

JEOL JXA-8900R Electron Probe X-ray Microanalyzer (EPMA)

Telephone No.

4083

Location

B3025

Responsible Professor

Ker-Chang Hsieh

Equipment

Electron Probe X-ray Microanalyzer (EPMA)can be used to analyze metals, electronic materials, ceramics, and minerals quantitatively and qualitatively. The elemental characteristic X-ray, secondary electrons, backscatter electrons images for large areas and high magnifications can be carried out.

Research

JEOL JXA-8900R Electron Probe X-ray Microanalyzer
Acceleration voltage: 0.2~40 kV
WDS: 5B~92U
EDS: 11Na~92U。
Qualitative and quantitative analyses of micro-area
SEI(scanning electron image) of large area
TOPO (Topography) and COMPO(Composition)image
X-Ray Mapping, SEI, BEI and line scan of large areas (within 26 mm x 26 mm) and small area (larger than 10mm x 10mm)

Technician/Student

Picture

Reference Link

http://khvic.nsysu.edu.tw/khvic/JL/69.htm