│ Precision Instruments Lab (MOST) │ Common Lab │ Research Lab │
Name |
Instrument name & model |
Prof-In-Charge |
Location |
Transmission Electron Microscopy Laboratory (I) |
JEOL 3010 STEM* |
張六文教授 |
MS1001 |
Transmission Electron Microscopy Laboratory (II) |
FEI Tecnai G2 F20 STEM* FEI CM200 TEM* |
張志溥教授 張六文教授 |
MS 1004 |
Transmission Electron Microscopy Laboratory (III) |
JEOL 2100 TEM* |
郭紹偉教授 |
MS 2011 |
Surface Analysis Laboratory |
JEOL JPS 9030 XPS* JEOL JAMP-9500F AEM* |
陳致光教授 |
MS3025 |
Scanning Electron Microscopy Laboratory (I) |
LEOL JXA-8530F FE-EPMA* JEOL 6330F FE-SEM* Zeiss Supra 55 FE-SEM |
王致傑教授 蔣酉旺教授 張志溥教授 |
MS3024 |
Scanning Electron Microscopy Laboratory (II) |
Zeiss Gemini 450 STEM* |
蔣酉旺教授 |
MS3022 |
X-ray Diffraction Laboratory |
Bruker D2 X-ray Diffractometer* Bruker D8 Discover Diffractometer (HR)* Bruker D8 Discover Diffractometer (PF)* |
周明奇教授 |
MS 6014 |
Emergent Crystalline Materials Laboratory |
|
周明奇教授 |
EN 2027-1 |
*科技部基礎核心設施 **科技部尖端晶體設施