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  • Analyzing Lab.

Title

Responsible Professor

Participative Professor

FEG TEM (FEI Tecnai)

Pouyan Shen

Bae-Heng Tseng / Chih-Pu Chang / Liuwen Chang

Scanning Electron Microscope (JOEL 6400)

New-Jin Ho

X-ray Diffraction Lab.

Mitch Ming-Chi Chou 

Liuwen Chang / Bing-Hwai Hwang

Polymer and Supramolecular Materials

Shiao-Wei Kuo

PHILIPS CM200 TEM

Pei-Ling Sun

New-Jin Ho / Chih-Pu Chang / Liuwen Chang

3010 AEM JEOL JEM-3010

Pouyan Shen

Bae-Heng Tseng / Chih-Pu Chang / Liuwen Chang

Auger, ESCA

Bae-Heng Tseng

Ker-Chang Hsieh / Liuwen Chang

JEOL 6330TF FESEM

Liuwen Chang

JEOL JXA-8900R Electron Probe X-ray Microanalyzer (EPMA)

Ker-Chang Hsieh

  
  • Research Lab. 

Title

Responsible Professor

Participative Professor

Semiconductor Optoelectronics Lab.

Da-Ren Hang

  

Optical and Electrical Characterization Lab.

Bae-Heng Tseng

Tsung-Ming Tsai

Micro-Spctroscopy Lab.

Jui-Hung Hsu

  
 
 
  • Teaching Lab. 

 

Title

Responsible Professor

Participative Professor

Undergraduate Materials Lab.

Ker-Chang Hsieh

  

Undergraduate Optoelectronic Lab.

Wei-Hung Su

  

 

FEG TEM (FEI Tecnai)
Scanning Electron Microscope (JOEL 6400)
X-ray Diffraction Lab.
Polymer and Supramolecular Materials
PHILIPS CM200 TEM
3010 AEM JEOL JEM-3010
JEOL JXA-8900R Electron Probe X-ray Microanalyzer (EPMA)
Undergraduate Materials Lab
Undergraduate Optoelectronic Lab
Micro-Spctroscopy Lab.
Auger, ESCA
JEOL 6330TF FESEM
Semiconductor Optoelectronics Laboratory
Optical and Electrical Characterization Lab